The MGX B-52 Legacy 2 SIR test board evaluates the activity of flux residue at both the I/O and under component terminations. MGX B-52 Legacy 2 is used to characterize solder paste, process development, and process control. The B-52 Legacy 2 card is one of our most popular test cards.
The MGX B-52 Legacy 1 SIR test board evaluates the activity of flux residue at both the I/O and under component terminations. One of the unique features of these test boards is the QFP 160 and QFP 80 SIR comb patterns placed underneath these components. These combs allow the assembler to detect bath loading and rinse issues within the cleaning process.
The MGX B-52 Legacy 3 test board is designed to detect inadequate rinsing and aged wash chemistry when cleaning production assemblies. The QFP 80 and QFP 160 in Quadrants 3 and 4 have SIR comb patterns located under the component termination.
The MGX Mixed Technology SIR Test Board is a purpose built Surface Insulation Resistance (SIR) and electrochemical reliability test platform designed to evaluate flux behavior, cleaning effectiveness, and process robustness across a range of component geometries. Combining fine-pitch, bottom-terminated, through-hole, and passive components on a single standardized board enables comprehensive cleanliness and reliability characterization aligned with J-STD-001 Section 8 requirements.
