Process Assessment Investigation
Testing both Functional and SIR Circuits allows for the process to be qualified to assess acceptable levels of flux and process residues. Functional-SIR testing using the Umpire 41 test system is representative of actual production assembly.
Overview
The Process Assessment Investigation uses the Umpire 41® Functional-SIR Test Board to assess the materials, assembly process conditions, and cleanliness to determine whether the assembly process delivers acceptable levels of flux residues and process contamination. The test instrumentation, in combination with the Umpire 41, allows for electrical testing in temperature, humidity, and bias conditions using electrical active and SIR components.
Surface Insulation Resistance (SIR) testing evaluates the long-term reliability of electronic materials and processes by exposing circuits to controlled temperature, humidity, and electrical bias to identify potential failure mechanisms caused by electrochemical reactions. It assesses production process chemistries such as solder masks, flux, paste, and wire, as well as assembly processes like reflow, SMT parameters, and cleaning methods. High-temperature and humidity aging tests simulate years of service in days, providing critical insights into material integrity and reliability. With tailored test profiles, SIR testing helps predict service life, ensuring quality and durability in electronic assemblies.
Electric systems, hardware, harnesses, and individual circuit board cleanliness have become critical aspects of electronic hardware reliability. Cleanliness of electronic hardware has historically been identified by general visual conditions, particles and debris, and the general conductivity average of a solvent after exposure of the entire circuit board. Still, these general tests have not proven to correlate to predictive hardware.
The Umpire 41 test board assessment, offered in collaboration with testing from Foresite and Magnalytix reliability test labs, addresses the cumulative and interactive effects of the electronic assembly process.
Why Choose This Test?
- Tests sensitive circuits
- Tests circuits pad to pad, via to hole, and lead to lead
- Tests for what residues are present and their impact on circuit performance
- Tests multiple processes (SMT- Selective – Manual)
- Tests for collective residues across the assembly
- Tests for the collective impact of residues both applied and removed
Industries Served
How Process Assessment Investigation Works
Sample Preparation
The test specimen is placed in a controlled environment with temperature, humidity, and electrical bias.
Exposure to Environmental Conditions
The sample undergoes high-temperature and humidity conditions to accelerate aging and simulate real-world stress.
Electrical Testing of Functional and SIR Circuits
In circuit testing, combined with electrical resistance between conductors is continuously monitored to detect leakage currents and potential failures.
Equipment Used
Magnalytix – Foresite Umpire Test System
Automated Functional and SIR testing system providing real-time resistance measurements under controlled environmental conditions.
Environmental Chamber
Precision-controlled chamber for maintaining temperature and humidity during SIR testing.
Umpire 41 Test Board
For testing both functional and SIR circuits on the same board.
Key Features & Benefits
In-Circuit Testing
Electrical performance when exposed to Harsh Climatic Conditions
SIR Testing
Evaluates the effects of process residues pad-to-pad, hole-to-hole, and via-to-pad.
Ionic Analysis
Localized Extraction (C3) in combination with IC Ion Chromatography analysis.
Visual Inspection
IPC 610 inspection.
Cross Section
Visual analysis on specific components.
Qualify Manufacturing Plan
Qualify your manufacturing process per IPC J-STD-001.
Standards
Lab Testing Standards
- IPC J-STD-001J Section 8 Cleanliness
Deliverables & Reporting
What You Receive
Detailed Test Report
Comprehensive analysis including resistance trends, environmental conditions, and failure detection.
Graphical Data Interpretation
Visual representation of resistance changes over time for easy evaluation.
Consultation
Expert insights into test results and recommendations for process improvement over teams.
Turnaround Time & Options
Standard Timeline
Customization Options
- Custom voltage and humidity settings
- Extended duration testing
- Specialized test coupon designs
- Failure mode analysis with cross-sectional imaging
- Comparative studies for process optimization