MGX QFP 80-1 Chip (Back View)
MGX QFP 80-1 Chip (Back View)
MGX QFP 80-1 Chip (Front View)

MGX QFP 80-1 Chip

Description

MGX QFP 80-1 is representative of the leaded QFN 80 components with smaller pad size of 0.25 mm by 1.0 mm and SIR comb under the component termination. This component is designed to detect cleaning and rinsing issues.

Details

80-Leads, Body 17.5×17.5 mm, Pitch 0.65 mm

Compatible Test Cards
MGX B-52 Legacy 3

MGX B-52 Legacy 3

The MGX B-52 Legacy 3 test board is designed to detect inadequate rinsing and aged wash chemistry when cleaning production assemblies. The QFP 80 and QFP 160 in Quadrants 3 and 4 have SIR comb patterns located under the component termination.