QFN 48-11 SIR Glass Chiplet After Soldering.png
QFN 48-11 SIR Glass Chiplet After Soldering.png
QFN 48-11 SIR Glass Chiplet After Cleaning.png

QFN 48-11 SIR Glass Chiplet

Description

The SIR Glass QFN-48 component is a 48-lead, glass-substrate QFN package. It is designed specifically for visual flux residue inspection, cleaning process characterization, and surface insulation resistance (SIR) testing. Enabling controlled evaluation of electrochemical cleanliness, flux behavior, and process reliability in accordance with the requirements of J-STD-001 Section 8.

Details

48-Leads, Body 7.8 x 7.8 mm, Pitch 0.5 mm

Compatible Test Cards
MGX Mixed Technology SIR Test Board

MGX Mixed Technology SIR Test Board

The MGX Mixed Technology SIR Test Board is a purpose built Surface Insulation Resistance (SIR) and electrochemical reliability test platform designed to evaluate flux behavior, cleaning effectiveness, and process robustness across a range of component geometries. Combining fine-pitch, bottom-terminated, through-hole, and passive components on a single standardized board enables comprehensive cleanliness and reliability characterization aligned with J-STD-001 Section 8 requirements.